The paper, entitled “Millimeter-wave thickness-deviation measurement system,” was chosen as one of 19 finalists prior to the conference. At the meeting, Day presented an oral elevator pitch and poster to a panel of judges who selected his work as the winner of the competition.
The prize not only comes with a financial package, but also includes an invitation to write an article for IEEE MTT-S Microwave Magazine.
“It’s is an incredible honor to be recognized by IEEE for my recent efforts,” says Day. “It has been such a pleasure being able to collaborate with Matthew Dwyer and Dan van der Weide on developing novel millimeter-wave systems for imaging and measurement—to be acknowledged for our work is all the more encouraging and exciting.”