Paul Voyles Associate Professor Address/E-mail Program Affiliations Education Fields of Interest Publications Awards & Honors Summary For additional information, see my

Contact Information

223 Materials Science & Engineering 1509 University Avenue Madison, WI 53706-1595

Tel: 608/265-6740 Fax: 608/262-8353 E-mail: voyles@engr.wisc.edu

Program Affiliations

• Materials Science and Engineering

• Materials Science Program

Education

• Ph. D. in Physics, University of Illinois at Urbana-Champaign, January 2001.
• M. S. in Physics, University of Illinois at Urbana-Champaign, May 1999.
• B. A. in Physics, Oberlin College, May 1996.

Fields of Interest

• electron microscopy: atomic resolution Z-contrast STEM
• electron energy loss spectroscopy
• growth, structure, and defects in electronic and photonic materials
• nanoscale order in glassy materials

Publications

• "Prospects for 3D, nanometer-resolution imaging by confocal STEM" J. J. Einspahr and P. M. Voyles, Ultramicroscopy 106, 1041 (2006).
• "Aluminum Nanoscale Order in Amorphous Al92Sm8 Measured by Fluctuation Electron Microscopy", W.G. Stratton, J. Hamann, J.H. Perepezko, P.M. Voyles, X. Mao and S.V. Khare, Appl. Phys. Lett. 86, 141910 (2005).
• "Evidence for a New Class of Defects in Highly n-doped Si: Donor-Pair-Vacancy-Interstitial Complexes" P. M. Voyles, D. J. Chadi, P. H. Citrin, D. A. Muller, J. L. Grazul, P. A. Northrup, and H-J. L. Gossmann, Phys. Rev. Lett 91, 125505 (2003).
• "Atomic-Scale Imaging of Individual Dopant Atoms and Clusters in Highly n-type Bulk Si" P. M. Voyles, D. A. Muller, J. Grazul, P. H. Citrin, and H.-J. Gossmann, Nature 416, 826 (2002).
• "Absence of an Abrupt Phase Change from Polycrystalline to Amorphous in Silicon with Deposition Temperature" P. M. Voyles, J. E. Gerbi, M. M. J. Treacy, J. M. Gibson, and J. R. Abelson, Phys. Rev. Lett. 86, 5514 (2001).

Selected Awards, Honors and Societies

• Best Materials Paper in Microscopy and Microanalysis 2004
• National Science Foundation CAREER Award, January 2004.
• Journal of Physics: Condensed Matter Top Paper of 2003
• Microscopy Society of America Poster Award: First Place, Physical Applications and Microscopy and Microanalysis, August 2002.
• Materials Research Society Graduate Student Award, April 2000.
• Howe Prize in Physics, Oberlin College, May 1996.
• member of Microscopy Society of America, Materials Research Society, and the American Physical Society

Summary

My research focuses on electron microscopy characterization of materials. I apply atomic-resolution Z-contrast microscopy and electron energy loss spectroscopy to problems in semiconductor growth and defects and photonic materials. I also use systematic electron diffraction measurements (fluctuation electron microscopy) to study nanoscale ordering in glassy materials, including metallic, oxide, and chalcogenide glasses.

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