MS&E 770: Methods of Surface and Interface Characterization

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MS&E 770 - Methods of Surface and Interface Characterization

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Catalog Description: 770 Methods of Surface and Interface Characterization. I,Alt Yrs; 3cr. Principles and engineering applications of major methods of structural and chemical characterization of surfaces and interfaces, including scanning electron microscopy, low-energy electron diffraction, Auger electron spectroscopy, ESCA, ion scattering methods, and ellipsometry, mostly in metals and metal/non-metal structures. Lecture and lab project. P:MS&E 570 or cons inst.
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Copyright 2007 The Board of Regents of the University of Wisconsin System
Date last modified: 04-Aug-2007
Content by: kailhofer@engr.wisc.edu
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