MS&E 748: Structural Analysis of Materials

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MS&E 748 - Structural Analysis of Materials

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Catalog Description: 748 Structural Analysis of Materials. II; 3cr. Lab techniques used in studying dislocations and other structural imperfections. P:MS&E 448.
Course Prerequisite(s)

MS&E 448 or consent of the instructor
Prerequisite knowledge and/or skills

Basic crystallography: unit cell, Bravais lattice, lattice with a basis, Miller indices
Geometric diffraction: reciprocal lattice, Ewald sphere
Textbook(s) and/or other required material

Introduction to Conventional Transmission Electron Microscopy, Marc de Graef, Cambridge University Press, 2003
Course objectives

Enable students to critically read the scientific literature containing applications of TEM to materials.
Enable students to select the appropriate TEM method to solve a given materials problem and understand the resulting data.
Class/laboratory schedule

Basics of TEM: electron sources; electromagnetic lenses; geometric and wave optics applied to TEM; lens aberrations and resolution
Electron diffraction: geometry of electron diffraction including Ewald sphere with relrods; selected area, convergent beam, and Kikuchi electron diffraction; phase identification, sample orientation, lattice parameter, and point/space group measurement.
Electron imaging: diffraction contrast imaging of crystals and crystal defects; dynamical electron diffraction including Bloch wave formalism and simulation; high-resolution imaging by phase contrast TEM and Z-contrast STEM
Electron microanalysis: physical basis of electron microanalysis: ionization cross sections and x-ray emission; microanalysis by energy dispersive x-ray spectroscopy (EDS) and electron energy loss spectroscopy (EELS); STEM spectrum imaging; energy-filtered TEM
Students interested in learning to use a TEM should also register for MS&E 758: Transmission Electron Microscopy Lab.
Person(s) who prepared this description

Paul Voyles

Copyright 2007 The Board of Regents of the University of Wisconsin System
Date last modified: 04-Aug-2007
Content by: kailhofer@engr.wisc.edu
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