Materials Science Program
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Electron Microscopy and Image Processing Facilities

Electron microscopy facilities in the Materials Science Center offer complete analytical and imaging capabilities for both bulk and electron-transparent specimens.

Available transmission electron microscopes (TEMs) include: a JEOL 200CX, 200 kV TEMSCAN with complete TEM- and STEM-mode operation and EDS; a Vacuum Generators HB-501 ultra-high vacuum, field-emission STEM with light element EDS, an electron energy loss spectroscopy; and a 200 kV high-resolution Philips CM20 ULTRA TWIN TEM with better than 2 resolution, light element EDS and full-image processing and analysis capabilities.

Scanning electron microscopes (SEMs) include a JEOL JSM 6100 SEM with full imaging and light element EDS, a Noran Instruments ADEM 30 kV SEM with EDS that handles very large samples; and a LEO Gemini 982 fully digital, high-resolution SEM.

Image enhancement and analysis facilities include the image processing and feature analysis systems bundled with the electron microscopes detailed above and a stand-alone system consisting of a Megavision 1024XM high-resolution image processor and a high resolution slow-scan TV camera. Images can be acquired directly from optical microscopes, photographs, and negatives. Once they are acquired, images can be enhanced through the modification of brightness, contrast, edge enhancement, and sharpness, etc. Images can then be segmented to identify specific features for further processing or measurement. Furthermore, images can be modified geometrically through stretching and warping to allow measurements from the combination of multiple images.

Electron microscopy facilities supported outside of the Materials Science Center include a 120 kV LEO EM 912 energy-filtred TEM with an integrated omega filter and a Hitachi S900 high-resolution SEM with 8 resolution. There also is a scanning laser confocal microscope that can, through the use of image processing, produce three-dimensional images of optically transparent materials. These are found in the Integrated Microscopy Resource, a national facility used primarily for biological research, but that is available for materials research. In addition, the geology department supports an electron microprobe for quantitative X-ray microanalysis.

Copyright 1996 The Board of Regents of the University of Wisconsin System
Date last modified: 30-Sep-96 15:58:56
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