Bulk and thin-film materials characterization facilities include X-ray diffraction equipment and optical and electron microscopes. X-ray equipment includes a Picker diffractometer, powder cameras for high temperature studies, and Laue, Read, and Weisenberg cameras.

A Nicolet-STOE double diffractometer system gives the additional capabilities of performing X-ray studies in transmission mode at room temperature and at high temperatures, using parallel optics for thin-film studies, and collecting X-ray spectra in parallel using position-sensitive detectors. A Zeiss ultraphot for micro- and macro-metallography studies and an Olympus metallograph are available.