Saluja, Kewal K.

My general research interests are test generation and testable and reliable design of digital systems. In my research I make extensive use of VLSI CAD and analysis tools. The research involves modeling of faults, designing digital circuits, test generation, design modification for enhancing testability, and built-in self-testing designs.

I am investigating techniques to make the test generation and fault simulation process efficient for both combinational and sequential circuits. In the area of built-in self-test, my focus is on regular structures such as programmable logic arrays and RAMs. I am developing algorithms and tools that can be used to synthesize testable sequential circuits using partitioning and partial scan approach.

Much of my work is performed using facilities of the VLSI digital system laboratory. The laboratory houses a number of SUN stations with color monitors for programming and design.

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Computer Engineering Seminar: : Friday Seminars

Copyright 2008 The Board of Regents of the University of Wisconsin System
Date last modified: 26-Mar-2008
Content by: saluja@engr.wisc.edu
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