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ECE 335 - Microelectronic Devices

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Catalog Description
335 Microelectronic Devices. I, II; 3 cr (P-E). Characteristics of semiconductors; study of physical mechanisms and circuit modeling of solid state electronic and photonic devices; principles of microelectronic processing and examples of integrated circuits. P: ECE 220 & 230.

Course Prerequisite(s)

Prerequisite knowledge and/or skills

Textbook(s) and/or other required material

Course objectives

The main goal is to provide the students with an understanding of the relation between physical structure and circuit behavior of semiconductor active devices. The emphasis is on simple models of the semiconductor, the discussion of the properties of potential barriers and field effect, with the MOSFET as the centerpiece of the course. Simple one-device circuits are used to introduce non-linear behavior, and make the connection to the device physics. The students will learn the relation between external circuit parameters (as used in SPICE) and the device internal structure. At the end of the course the students will know the basic mechanism of rectification, amplification and switching and their implementation with various types of semiconductor devices.

Topics covered

Class/laboratory schedule

Contribution of course to meeting the professional component
This course contributes primarily to the students' knowledge of engineering topics, and does provide design experience.

The following statement indicates which of the following considerations are included in this course: economic, environmental, ethical, political, societal, health and safety, manufacturability, sustainability.

Relationship of course to undergraduate degree program objectives and outcomes
This course primarily serves students in the department. The information below describes how the course contributes to the undergraduate program objectives.

Assessment of student progress toward course objectives

Three Laboratory Projects:

1.Measurement of p-n junction diode electrical characteristics with curve tracer; problems worked using data.

2.Measurement of bipolar junction transistor electrical characteristics with curve tracer; problems worked using data.

3.Measurement of field-effect transistor electrical characteristics with curve tracer; examination of integrated circuits; problems worked using data.

Midterm exam

Final exam

Person(s) who prepared this description



Copyright 2007 The Board of Regents of the University of Wisconsin System
Date last modified: 02-Sep-2007
Content by: ece@engr.wisc.edu
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